Growth and Characterization of Aluminium Doped Zinc Selenide (ZnSe:Al) Thin Films

Aluminum-doped zinc selenide thin films were prepared using the chemical bath deposition technique. The films were characterized to obtain the optical properties, structural properties, and surface morphology using the Cary 300 UV/Visible Spectrophotometer- at normal incidence of light in the wavelength range of 200nm-800nm, the Rigaku miniflex 630 diffractometer, and the JOEL-JSM 7600F machine respectively. The deposited thin films have high absorbance in the UV region with low absorbance in the visible region and low transmittance in the UV region with high transmittance in the visible region. The XRD plot depicted that the thin films possess a hexagonal wurtzite structure which decreases its crystallinity with deposition time. The surface morphology analysis showed that the surface structure of the thin films is composed of densely packed spherical particles and from the EDX analysis, it is observed that the Zn/Se compositional ratio increases with deposition time.